Title
Scalable and efficient integrated test architecture
Abstract
This paper presents the test instruction set architecture (TISA), an invention that can enable scalable interactive testing to leverage the experience of embedded computing. This approach is applied to an 1149.1 system, obtaining a processor able to efficiently handle instrument-based operations.
Year
DOI
Venue
2009
10.1109/TEST.2009.5355811
Austin, TX
Keywords
Field
DocType
instruction sets,integrated circuit testing,logic CAD,1149.1 system,embedded computing,instrument-based operation,integrated test architecture,processor,scalable interactive testing,test instruction set architecture
Architecture,Computer architecture,Instruction set,Computer science,Interactive testing,Real-time computing,Software,Maintenance engineering,Embedded system,Scalability
Conference
ISSN
ISBN
Citations 
1089-3539
978-1-4244-4867-8
0
PageRank 
References 
Authors
0.34
0
3
Name
Order
Citations
PageRank
Michele Portolan151.59
suresh goyal212013.77
Bradford G. Van Treuren342.47