Name
Abstract | ||
|---|---|---|
Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is practically effective. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1109/ATS.2009.19 | Asian Test Symposium |
Keywords | Field | DocType |
automatic test pattern generation,fault diagnosis,large scale integration,tolerance analysis,LSI testing method,error tolerant circuits,fault acceptability,selective hardening,threshold test generation,yield enhancement,acceptable fault,error significance,error tolerance,test generation model,threshold testing | Automatic test pattern generation,Error tolerance,Computer science,Tolerance analysis,Real-time computing,Electronic engineering,Frequency modulation,Electronic circuit,Test compression,Reliability engineering | Conference |
ISSN | ISBN | Citations |
1081-7735 | 978-0-7695-3864-8 | 6 |
PageRank | References | Authors |
0.56 | 10 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hideyuki Ichihara | 1 | 96 | 18.92 |
| Kenta Sutoh | 2 | 6 | 0.56 |
| Yuki Yoshikawa | 3 | 28 | 4.51 |
| Tomoo Inoue | 4 | 352 | 47.23 |