Title
Analyses of single-stage complementary self-biased CMOS differential amplifiers
Abstract
This paper analyzes and compares two complementary self-biased CMOS differential amplifiers. The two amplifiers differ only in terms of the number of output nodes, namely one is single-ended, the other being fully differential. Furthermore, the amplifiers are completely self-biased embedding the negative feedback in the biasing loop which makes them highly resistant to process, supply voltage and temperature variations. Both circuits are analyzed on the basis of small signals and expressions for gain are derived. The two amplifier topologies are simulated yielding a good match between the obtained results and the theory. Finally, discussed amplifiers featuring high gain and PVT immunity are well-suitable for implementation in nanometer CMOS processes.
Year
DOI
Venue
2012
10.1109/NORCHP.2012.6403115
2009 NORCHIP
Keywords
Field
DocType
CMOS analogue integrated circuits,circuit feedback,differential amplifiers,PVT immunity,amplifier topology,biasing loop,nanometer CMOS process,negative feedback,single-stage complementary self-biased CMOS differential amplifier analysis,supply voltage,temperature variations
Transistor array,Fully differential amplifier,Computer science,Direct-coupled amplifier,Negative feedback,Electronic engineering,CMOS,Electronic circuit,Current sense amplifier,Amplifier
Conference
ISBN
Citations 
PageRank 
978-1-4673-2222-5
0
0.34
References 
Authors
4
2
Name
Order
Citations
PageRank
Vladimir Milovanovic113.67
Horst Zimmermann22915.60