Name
Title | ||
|---|---|---|
A 10 V Josephson Voltage Standard comparison between NIST and Inmetro as a link to BIPM |
Abstract | ||
|---|---|---|
This paper describes a 10 V Josephson Voltage Standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (Inmetro) using automatic data acquisition. The results were in agreement to within 1.1 nV and the mean difference between the two JVSs at 10 V is 0.54 nV with a pooled combined standard uncertainty of 1.48 nV. Considering a recent JVS comparison between NIST and the Bureau International des Poids et Mesures (BIPM), the difference between Inmetro and the BIPM thus was found to be -0.26 nV with a standard uncertainty of 1.76 nV. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/CPEM.2010.5543454 | IEEE T. Instrumentation and Measurement |
Keywords | Field | DocType |
josephson effect,data acquisition,measurement standards,voltage measurement,bipm,bureau international des poids et mesures,inmetro,instituto nacional de metrologia,normalização e qualidade industrial,josephson voltage standard,nist,national institute of standards and technology,automatic data acquisition,pooled combined standard uncertainty,voltage -0.26 nv,voltage 0.54 nv,voltage 1.1 nv,voltage 1.48 nv,voltage 1.76 nv,voltage 10 v,uncertainty,oscillations,radiation detectors,oscillators,measurement uncertainty,automation,radiation detector | Mean difference,Josephson effect,Josephson voltage standard,Measurement uncertainty,Electronic engineering,NIST,Physics | Journal |
Volume | Issue | ISBN |
60 | 7 | 978-1-4244-6795-2 |
Citations | PageRank | References |
1 | 0.59 | 3 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Regis Pinheiro Landim | 1 | 18 | 5.18 |
| Yi-Hua Tang | 2 | 39 | 11.10 |
| Edson Afonso | 3 | 1 | 0.59 |
| Vitor Ferreira | 4 | 1 | 0.59 |