Title
Proposal of a universal test scene for depth map evaluation
Abstract
Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.
Year
DOI
Venue
2013
10.1109/ICCE.2013.6486836
IEEE Trans. Consumer Electronics
Keywords
Field
DocType
time-of-flight,temperature condition,image processing,mobile camera,depth maptesting environment,consumer devices,depth map generation,consumer electronics,IR sensor,light intensity condition,universally accessible object selection,consumer electronic devices,infrared cameras,ToF camera,universal test scene,infrared sensor,image sensors,smart imaging,time-of-flight camera,tof,depth map testing environments,scene layout measurement,depth map generation method,depth map evaluation,smart phones,Middlebury database,ir cameras
Computer vision,Image sensor,Computer graphics (images),Computer science,Image processing,Artificial intelligence,Depth map
Journal
Volume
Issue
ISSN
59
2
2158-3994
ISBN
Citations 
PageRank 
978-1-4673-1361-2
0
0.34
References 
Authors
27
3
Name
Order
Citations
PageRank
Istvan Andorko1142.35
P. M. Corcoran241482.56
Petronel Bigioi3434.76