Name
Title | ||
|---|---|---|
RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology |
Abstract | ||
|---|---|---|
This paper focuses on the RF BIST architecture of the receive path of an RF transceiver processed in the NXP in house CMOS technology with 0.14μm gate length. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1109/ETS.2013.6569387 | Test Symposium |
Keywords | Field | DocType |
CMOS integrated circuits,built-in self test,integrated circuit testing,radio transceivers,CMOS technology,NXP,RF BIST architecture,RF transceiver,receive part,receive path,size 0.14 mum | Phase-locked loop,Transceiver,Computer science,Attenuator (electronics),CMOS,Radio frequency,Electronic engineering,Electrical engineering,Test strategy,Built-in self-test,Gain measurement | Conference |
ISSN | ISBN | Citations |
1530-1877 | 978-1-4673-6376-1 | 0 |
PageRank | References | Authors |
0.34 | 0 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Christophe Kelma | 1 | 49 | 5.21 |
| Sébastien Darfeuille | 2 | 7 | 1.99 |
| Andreas Neuburger | 3 | 0 | 0.34 |
| Andreas Lobnig | 4 | 0 | 0.34 |