Name
Title | ||
|---|---|---|
A fast reliability-aware approach for analogue integrated circuits based on Pareto fronts |
Abstract | ||
|---|---|---|
Reliability becomes a critical challenge in analogue integrated circuits (ICs) design in deep sub-micron region. In order to manufacture ICs with high quality, methodology and analysis must include reliability consideration in design loop. In this paper, we propose a new statistical reliability-aware approach to evaluate circuit performance under ageing effects and process variations. BSIM4 transistor physical parameters are investigated. The non-dominated sorting-based multi-objective evolutionary algorithms is used to find the worst-case aged circuit performances. This approach is studied with a two stage Miller-operational-amplifier (Op-Amp) with 65nm CMOS technology. Simulation results show that the Op-Amp is HCI non-sensitive but suffer from NBTI degradation. Compared to traditional Monte-Carlo method, simulation time is reduced to 40%, with a trade-off of only 0.05% to 1.7% accuracy loss. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1109/NEWCAS.2013.6573648 | NEWCAS |
Keywords | Field | DocType |
cmos analogue integrated circuits,pareto analysis,evolutionary computation,integrated circuit design,integrated circuit reliability,operational amplifiers,bsim4 transistor physical parameters,cmos technology,hci,ic design,monte-carlo method,nbti degradation,pareto fronts,ageing effects,analogue integrated circuits,circuit performance evaluation,deep submicron region,design loop,nondominated sorting-based multiobjective evolutionary algorithms,op-amp,process variations,size 65 nm,statistical reliability-aware approach,two stage miller-operational-amplifier,worst-case aged circuit performances,op amp,aging,monte carlo method,semiconductor device modeling | Computer science,Circuit extraction,Circuit design,Control engineering,Sorting,CMOS,Electronic engineering,Integrated circuit design,Mixed-signal integrated circuit,Physical design,Integrated circuit | Conference |
ISSN | ISBN | Citations |
2472-467X | 978-1-4799-0618-5 | 0 |
PageRank | References | Authors |
0.34 | 5 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hao Cai | 1 | 60 | 21.94 |
| Petit, H. | 2 | 0 | 0.34 |
| J. Naviner | 3 | 12 | 3.88 |