Name
Abstract | ||
|---|---|---|
This article highlights the challenge of making dynamic IJTAG operational. While the PDL allows flexibility, it generates problems for the back-end, which is how IJTAG operations are combined and executed. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1109/MDAT.2013.2278541 | Design & Test, IEEE |
Keywords | Field | DocType |
IEEE standards,automatic test pattern generation,IJTAG operations,PDL,automatic test pattern generation,back-end,dynamic IJTAG,IJTAG,ISA,Interactive Testing | Automatic test pattern generation,Software engineering,Computer science,Interactive testing,Electronic engineering,Embedded system | Journal |
Volume | Issue | ISSN |
30 | 5 | 2168-2356 |
Citations | PageRank | References |
4 | 0.51 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Michele Portolan | 1 | 11 | 5.50 |
| Bradford G. Van Treuren | 2 | 7 | 1.35 |
| suresh goyal | 3 | 120 | 13.77 |