Paper Info
Title
Optimal allocation of testers to products with a queue time restriction in sort testing
Abstract
The test of each wafer product in Sort (final IC testing) is done by allocating a tester and an appropriate Sort Interface Unit (SIU) to the product, to perform the test programs over the wafer. This allocation problem is a more complex allocation problem in the presence of a queue time restriction. In this paper, this problem is formulated and solved to determine the optimal allocation of testers and SIU's to wafer products over a planning horizon, such that overall WIP throughout the planning horizon is minimized. The optimal solution also comprehends restrictions on the amount of wafers that may be shipped to other testing sites and replenishment policies regarding new SIU's.
Year
DOI
Venue
2013
10.1109/ICRA.2013.6631077
Robotics and Automation
Keywords
Field
DocType
automatic test equipment,integrated circuit testing,optimisation,queueing theory,sorting,ATE,IC testing,SIU,WIP,automatic test equipment,complex allocation problem,optimal allocation,optimisation,planning horizon,product testing,queue time restriction,sort interface unit,sort testing,test programs,wafer product,Allocation Problem,Automatic Test Equipment (ATE),Optimization,Queue Time,Throughput
Mathematical optimization,Time horizon,Computer science,Control theory,Automatic test equipment,Queue,Wafer Product,sort,Sorting,Real-time computing,White-box testing,Queueing theory
Conference
Volume
Issue
ISSN
2013
1
1050-4729
ISBN
Citations 
PageRank 
978-1-4673-5641-1
0
0.34
References 
Authors
2
1
Name
Order
Citations
PageRank
Adar Kalir101.69