Name
Title | ||
|---|---|---|
Characterization of Metrological Grade Analog-to-Digital Converters Using a Programmable Josephson Voltage Standard |
Abstract | ||
|---|---|---|
A test bench has been developed for systematic characterization of high-resolution analog-to-digital converters. The reference signal is generated by a programable Josephson voltage standard. Three 24-bit digitizers have been characterized. Noise performance has been measured at direct current using the Allan deviation, whereas integral nonlinearity has been measured with quasi-dynamic stepwise triangular waveforms at frequencies between 0.5 Hz and 1 kHz. None of the digitizers outperforms all others for each tested characteristics. Therefore, such a systematic characterization provides the overview needed to identify the most suitable digitizer for a given application. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/TIM.2011.2113950 | Instrumentation and Measurement, IEEE Transactions |
Keywords | Field | DocType |
analogue-digital conversion,integrated circuit noise,integrated circuit testing,digitizers,high-resolution analog-digital converters,integral nonlinearity,metrological grade analog-digital converters,noise performance,programmable Josephson voltage standard,quasidynamic stepwise triangular waveforms,reference signal,test bench,Analog-digital conversion,Josephson junctions,delta–sigma modulation,metrology,noise measurement | Allan variance,Integral nonlinearity,Josephson effect,Test bench,Noise measurement,Josephson voltage standard,Electromagnetics,Control engineering,Electronic engineering,Delta-sigma modulation,Electrical engineering,Mathematics | Journal |
Volume | Issue | ISSN |
60 | 7 | 0018-9456 |
Citations | PageRank | References |
5 | 2.00 | 8 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Frédéric Overney | 1 | 49 | 11.88 |
| Alain Rüfenacht | 2 | 96 | 15.03 |
| Braun, J. | 3 | 11 | 2.96 |
| Blaise Jeanneret | 4 | 85 | 23.47 |