Name
Title | ||
|---|---|---|
Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling |
Abstract | ||
|---|---|---|
This paper presents an application of the ICIM-CI model to the prediction of the susceptibility of ICs (Integrated Circuits) to environmental disturbances in avionic boards. The method is illustrated by the obsolescence study of three commercial operational amplifiers (Op-Amps) showing quasi-identical electrical characteristics and pin-to-pin compatibility, through the comparison of their respective conducted immunities. The model is developed in VHDL-AMS language, and the simulation results are validated through comparison with Direct Power Injection measurements. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1109/EMCCompo.2013.6735172 | Electromagnetic Compatibility of Integrated Circuits |
Keywords | DocType | Citations |
electromagnetic compatibility,hardware description languages,immunity testing,integrated circuit modelling,operational amplifiers,dpi measurement technique,vhdl-ams modeling,avionic boards,conducted immunity,environmental disturbances,integrated circuit susceptibility,op-amps,pin-to-pin compatibility,quasiidentical electrical characteristics,emc,icim-ci,integrated-circuit,op- amps,vhdl-ams,immunity measurement and modeling,obsolescence | Conference | 1 |
PageRank | References | Authors |
0.47 | 2 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hairoud, S. | 1 | 1 | 0.47 |
| Tristan Dubois | 2 | 7 | 2.81 |
| Tetelin, A. | 3 | 1 | 0.47 |
| Geneviève Duchamp | 4 | 12 | 5.38 |