Abstract | ||
---|---|---|
The distribution of bugs in software systems has been shown to satisfy the Pareto principle, and typically shows a power-law tail when analyzed as a rank-frequency plot. In a recent paper, Zhang showed that the Weibull cumulative distribution is a very good fit for the Alberg diagram of bugs built with experimental data. In this paper, we further discuss the subject from a statistical perspective, using as case studies five versions of Eclipse, to show how log-normal, Double-Pareto, and Yule-Simon distributions may fit the bug distribution at least as well as the Weibull distribution. In particular, we show how some of these alternative distributions provide both a superior fit to empirical data and a theoretical motivation to be used for modeling the bug generation process. While our results have been obtained on Eclipse, we believe that these models, in particular the Yule-Simon one, can generalize to other software systems. |
Year | DOI | Venue |
---|---|---|
2011 | 10.1109/TSE.2011.54 | Software Engineering, IEEE Transactions |
Keywords | Field | DocType |
Pareto analysis,Weibull distribution,eclipses,Pareto principle,Weibull cumulative distribution,eclipse system,software systems,statistical perspective,Software bug distribution,empirical research,object-oriented systems. | Data mining,Data modeling,Computer science,Software bug,Weibull distribution,Theoretical computer science,Software system,Cumulative distribution function,Eclipse,Pareto analysis,Pareto principle | Journal |
Volume | Issue | ISSN |
37 | 6 | 0098-5589 |
Citations | PageRank | References |
19 | 0.84 | 8 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Concas, G. | 1 | 19 | 1.18 |
M. Marchesi | 2 | 169 | 91.06 |
A. Murgia | 3 | 30 | 2.27 |
R. Tonelli | 4 | 237 | 18.42 |