Name
Abstract | ||
|---|---|---|
This article describes the New Scan Description Language (NSDL), which can efficiently describe embedded-testing resources for automated test generation. The authors evaluate NSDL in the context of the proposed IEEE P1687 standard. They conduct a theoretical analysis for each requirement of this standard and identify the NSDL code solution for each point. They also explain how NSDL naturally fits into an automated test flow. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/MDT.2010.1 | Design & Test of Computers, IEEE |
Keywords | Field | DocType |
automatic test pattern generation,embedded systems,industrial property,integrated circuit testing,system-on-chip,IEEE P1687 standard,NSDL code,SoC IP,automated test generation,common language framework,new scan description language,next-generation embedded testing,IEEE P1687,NSDL,built-in tests,design and test,languages,test generation,testing strategies,testing tools | Automatic test pattern generation,Computer architecture,System on a chip,Computer science,Decision support system,Industrial property | Journal |
Volume | Issue | ISSN |
27 | 5 | 0740-7475 |
Citations | PageRank | References |
3 | 0.50 | 4 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Michele Portolan | 1 | 5 | 1.59 |
| Goyal, S. | 2 | 3 | 0.50 |
| Bradford G. Van Treuren | 3 | 7 | 1.35 |
| Chiang, C. | 4 | 3 | 0.50 |