Paper Info
Title
A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations
Abstract
In this paper, a holistic yield recovery approach based on post manufacture tuning of RF circuits and systems under large as well as small multi-parameter process variations is developed. Marginally failing devices (small parameter deviations) are tuned using a nonlinear ¿Augmented Lagrange¿ algorithm driven optimization engine that includes test specification values and power consumption in its optimization framework. A novel built-in alternate tuning test is used to explicitly evaluate all the DUT specifications at each optimization iteration. For large parameter deviations well beyond the test specification limits of the DUT, determination of the different specification values is difficult. Such devices are tuned using a golden response tuning approach which optimizes the DUT specifications implicitly until the DUT is ¿good enough¿ to be tuned by the prior Augmented Lagrange algorithm. The proposed methodology enables yield recovery of devices not possible with earlier methods, avoids local minima and can be implemented at low cost.
Year
DOI
Venue
2010
10.1109/VTS.2010.5469539
VLSI Test Symposium
Keywords
Field
DocType
built-in self test,circuit tuning,integrated circuit testing,radiofrequency integrated circuits,DUT specifications,RF system tuning,augmented Lagrange algorithm,built-in alternate tuning test,holistic yield recovery approach,multiparameter perturbations,optimization framework,power consumption,response tuning approach
Nonlinear system,Test specification,Computer science,Control theory,Electronic engineering,Radio frequency,Maxima and minima,Electronic circuit,Perturbation (astronomy),Built-in self-test,Power consumption
Conference
ISSN
ISBN
Citations 
1093-0167
978-1-4244-6649-8
12
PageRank 
References 
Authors
0.79
8
4
Name
Order
Citations
PageRank
Vishwanath Natarajan1120.79
Shreyas Sen233754.39
Shyam Kumar Devarakond3131.19
Abhijit Chatterjee4599.10