Abstract | ||
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This paper presents a time-domain temperature sensor with process variation tolerance for low power on-chip thermal management. To achieve a suitable on-chip composition, the proposed sensor uses the externally applied code to save the area- and power-consumption. The proposed sensor is implemented using a 0.13μm CMOS process technology and its core area is 0.031mm2. The measurement results show that the energy per conversion rate is 0.67nJ/S at 1.2V supply voltage, conversion rate is 430k samples/sec, and sensing error is -0.63 ~ +1.04°C with 2nd order master curve and one-point calibration over the temperature range of 20 ~ 120°C. |
Year | DOI | Venue |
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2013 | 10.1109/ICCE.2013.6487022 | ICCE |
Keywords | Field | DocType |
cmos integrated circuits,calibration,low-power electronics,temperature sensors,thermal management (packaging),time-domain analysis,tolerance analysis,cmos process technology,low power on-chip thermal management,on-chip composition,one-point calibration,power consumption,power saving,process variation tolerance,second order master curve,sensing error,size 0.13 mum,temperature 20 degc to 120 degc,time-domain temperature sensor,voltage 1.2 v,low power electronics | Time domain,Atmospheric temperature range,Computer science,Voltage,Tolerance analysis,Electronic engineering,CMOS,Process variation,Electrical engineering,Calibration,Low-power electronics | Conference |
ISSN | ISBN | Citations |
2158-3994 | 978-1-4673-1361-2 | 0 |
PageRank | References | Authors |
0.34 | 4 | 5 |
Name | Order | Citations | PageRank |
---|---|---|---|
youngjae an | 1 | 5 | 1.22 |
kyungho ryu | 2 | 0 | 0.34 |
dong hoon jung | 3 | 0 | 0.68 |
seunghan woo | 4 | 0 | 0.34 |
Seong-ook Jung | 5 | 332 | 53.74 |