Paper Info
Title
A General Algorithm for Pattern Diagnosability of Distributed Discrete Event Systems
Abstract
Diagnosability is an important system property that determines at design stage how accurate any diagnostic reasoning can be on a partially observed system. A fault in a discrete-event system is diagnosable iff its occurrence can always be deduced from enough observations. It is well known that centralized diagnosability approaches lead to combinatorial explosion of the search space since they assume the existence of a monolithic model of the system. This is why very recently the distributed approaches for diagnosability began to be investigated, relying on local objects. On the other hand, diagnosis objectives are generalized from fault event to fault pattern that can represent multiple faults, repeating fault, sequences of significant events, repair of faults, etc. For pattern case, most existing approaches are centralized. In this paper, we propose a new distributed framework for pattern diagnosability. We first show how to recognize patterns by incrementally constructing local pattern recognizers through extended subsystems. Then we propose a structure called regional pattern verifier that is constructed from the subsystem where the pattern is completely recognized before showing how to abstract just the necessary and sufficient diagnosability information to further save the search space. Then the global consistency checking is based on another local structure called abstracted local twin checker to analyze pattern diagnosability. In this way, we avoid constructing global objects both for pattern recognition and for pattern diagnosability. The correctness of our distributed algorithm is theoretically proved and its efficiency experimentally demonstrated by the results of the implementation.
Year
DOI
Venue
2012
10.1109/ICTAI.2012.26
ICTAI), 2012 IEEE 24th International Conference
Keywords
Field
DocType
diagnostic reasoning,discrete event systems,distributed processing,fault diagnosis,pattern recognition,program diagnostics,search problems,abstracted local twin checker,centralized diagnosability,combinatorial explosion,design stage,diagnosis objectives,diagnostic reasoning,distributed algorithm,distributed discrete event systems,distributed framework,extended subsystems,fault event,fault pattern,general algorithm,global consistency checking,local objects,local pattern recognition,monolithic model,necessary and sufficient diagnosability information,partially observed system,pattern case,pattern diagnosability,regional pattern verifier,repeating fault,search space,system property,diagnosability analysis,discrete event systems,distributed diagnosis,knowledge representation,model-based diagnosis
Knowledge representation and reasoning,Synchronization,Computer science,Correctness,Theoretical computer science,Distributed algorithm,Combinatorial explosion,Diagnostic reasoning,Maintenance engineering,Trajectory
Conference
Volume
ISSN
ISBN
1
1082-3409
978-1-4799-0227-9
Citations 
PageRank 
References 
2
0.37
5
Authors
2
Name
Order
Citations
PageRank
Lina Ye1268.75
Philippe Dague224828.20