Name
Abstract | ||
|---|---|---|
This technical paper presents a simulation of three probes reflectometer system for complex reflection coefficient measurement. This involves designing a circuit of Reflectometer using Genesys software. The simulation results and data from published Three-Probe Reflectometer measurement system is being compared to show the accuracy of the simulation results. Using the design circuit, a microstrip circuit will be fabricated and complex reflection coefficients were measured using Vector Network Analyzer (VNA). A comparison was made between simulations, VNA and publishes data. From the comparison, it shows a close agreement between them. It shows that Microstrip Reflectometer can be used to measure Complex Reflection Coefficient. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/VECIMS.2010.5609339 | Virtual Environments Human-Computer Interfaces and Measurement Systems |
Keywords | Field | DocType |
microstrip circuits,microwave measurement,reflectivity,reflectometers,Genesys software,complex reflection coefficient,microstrip circuit,microstrip reflectometer,reflection coefficient measurement,reflectometer system,three probe reflectometer measurement system | Network analyzer (electrical),Microstrip circuits,Capacitor,System of measurement,Computer science,Simulation,Electronic engineering,Software,Reflection coefficient,Reflectivity,Microstrip | Conference |
ISSN | ISBN | Citations |
1944-9429 | 978-1-4244-5904-9 | 0 |
PageRank | References | Authors |
0.34 | 0 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Ermeey Abd Kadir | 1 | 0 | 0.34 |
| Husna Abd. Rahman | 2 | 0 | 0.34 |
| Nesamalar Kantasamu | 3 | 0 | 0.34 |
| Nor Wahidah Binti Misran | 4 | 0 | 0.34 |