Name
Abstract | ||
|---|---|---|
This paper presents the Open-Circuit Deadlock (OCD), a primitive that allows flexible and scalable securization of a JTAG target, from the cell to the system level. |
Year | DOI | Venue |
|---|---|---|
2010 | 10.1109/TEST.2010.5699300 | Test Conference |
Keywords | Field | DocType |
design for testability,JTAG target,open circuit deadlock,scalable securization,scan chain securization | Design for testing,Computer science,Deadlock,Scan chain,Real-time computing,Embedded system,Scalability,System level | Conference |
ISSN | ISBN | Citations |
1089-3539 | 978-1-4244-7206-2 | 0 |
PageRank | References | Authors |
0.34 | 1 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Michele Portolan | 1 | 5 | 1.59 |
| Bradford G. Van Treuren | 2 | 7 | 1.35 |
| Suresh Goyal | 3 | 0 | 0.34 |