Title
Electrical Impedance Tomography Reconstruction Through Simulated Annealing With Incomplete Evaluation Of The Objective Function
Abstract
The EIT reconstruction problem is approached as an optimization problem where the difference between a simulated impedance domain and the observed one is minimized. This optimization problem is often solved by Simulated Annealing (SA), but at a large computational cost due to the expensive evaluation process of the objective function. We propose here, a variation of SA applied to EIT where the objective function is evaluated only partially, while ensuring upper boundaries on the deviation on the behavior of the modified SA. The reconstruction method is evaluated with simulated and experimental data.
Year
DOI
Venue
2011
10.1109/IEMBS.2011.6091778
2011 ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY (EMBC)
Keywords
Field
DocType
algorithms,finite element analysis,finite element methods,temperature,electrodes,optimization problem,electric potential,electrical impedance tomography,simulated annealing,conductivity,finite element method,objective function,computer simulation,electrophysiology,impedance,image reconstruction,tomography
Simulated annealing,Iterative reconstruction,Mathematical optimization,Computer science,Electrical impedance,Finite element method,Electronic engineering,Tomography,Adaptive simulated annealing,Optimization problem,Electrical impedance tomography
Conference
Volume
ISSN
Citations 
2011
1557-170X
3
PageRank 
References 
Authors
0.52
4
5