Paper Info
Title
The importance of the fundamentals [Future Trends in I&M]
Abstract
Dear Readers, This time, our guest author for the column on Future Trends in I&M is Kristen M. Donnell. Kristen is indeed a brilliant woman, who works hard with delight and passion. This is also confirmed by all of the awards she has received: Missouri University of Science and Technology 2014 Faculty Teaching Award; IEEE Instrumentation and Measurement Society 2012 Outstanding Young Engineer Award; Teaching Commendation for 2012-2013 Academic Year; Outstanding Teaching Award for 2011-2012 Academic Year; the ASNT Fellowship Award for the 2002-2003 and 2006-2007 academic years; the Missouri S&T Chancellors Fellowship for 2006-2009; and the Missouri S&T University Transportation Center Graduate Fellowship for 2006. She also received the Materials Evaluation Best Paper Award in 2005 and placed first in the student poster contest at Third International Conference on Electromagnetic Near-Field Characterization and Imaging in 2007. I???m sure you will like her nice contribution.
Year
DOI
Venue
2015
10.1109/MIM.2015.7155775
Instrumentation & Measurement Magazine, IEEE
Field
DocType
Volume
Academic year,CONTEST,Control engineering,Engineering,Library science,Electrical engineering
Journal
18
Issue
ISSN
Citations 
4
1094-6969
0
PageRank 
References 
Authors
0.34
0
1
Name
Order
Citations
PageRank
Kristen M. Donnell13412.55