Abstract | ||
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A compact converter from capacitance to pulse width, suitable for interfacing integrated capacitive sensors is described. The circuit has been designed and fabricated using 0.32 mu m/3.3 V CMOS devices from the BCD6s process of STMicroelectroncs and occupies an area of 1025 x 515 mu m(2). Measurements performed on the test chip showed an excellent linearity, a temperature drift of 300 ppm/"C, and power consumption as low as 84 mu W for continuous operation. |
Year | DOI | Venue |
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2008 | 10.1109/ESSCIRC.2008.4681888 | Proceedings of the European Solid-State Circuits Conference |
Keywords | DocType | ISSN |
temperature measurement,capacitive sensor,chip,capacitors,capacitive sensors,signal processing,cmos integrated circuits,capacitance,sensors | Conference | 1930-8833 |
Citations | PageRank | References |
12 | 2.68 | 2 |
Authors | ||
3 |
Name | Order | Citations | PageRank |
---|---|---|---|
Paolo Bruschi | 1 | 62 | 17.83 |
Nicolo Nizza | 2 | 33 | 5.82 |
Michele Dei | 3 | 32 | 8.18 |