Title
A clocked, regenerative comparator in 0.12μm CMOS with tunable sensitivity
Abstract
This paper presents a clocked, regenerative comparator in a 1.5V/0.12 mu m CMOS technology, where the sensitivity is tuned by separately adjusting the tail currents of the latch and the input amplifier. The comparator reaches a sensitivity of 3.9mV (2GHz) and 9.2mV (3GHz) to achieve a Bit Error Rate (BER) of 10(-9). The power consumption of the comparator is 422 mu W at 2GHz and 584 mu W at 3GHz. The simulated standard deviation of the offset is sigma=16.1mV. Finally a circuit extension is proposed, where only with an additional resistor the influence of noise and mismatch can be reduced.
Year
DOI
Venue
2007
10.1109/ESSCIRC.2007.4430329
Proceedings of the European Solid-State Circuits Conference
Keywords
DocType
ISSN
amplifiers,cmos integrated circuits,standard deviation,bit error rate
Conference
1930-8833
Citations 
PageRank 
References 
1
0.50
4
Authors
2
Name
Order
Citations
PageRank
Bernhard Goll1156.08
Horst Zimmermann22915.60