Paper Info
Title
Analysis of flicker noise conversion to phase noise in CMOS differential LC oscillators
Abstract
AbstractAn analysis of the flicker noise conversion to close-in phase noise in complementary metal-oxide semiconductor CMOS differential inductance-capacitance LC-voltage controlled oscillator is presented. The contribution of different mechanisms responsible for flicker noise to phase noise conversion is investigated from a theoretical point of view. Impulse sensitivity function theory is exploited to quantify flicker noise to phase noise conversion process from both tail and core transistors. The impact of different parasitic capacitances inside the active core on flicker noise to phase noise conversion is investigated. Also, it is shown how different flicker noise models for core metal-oxide semiconductor MOS transistors may result in different close-in phase noise behaviors. Based on the developed analysis, design guidelines for reducing the close-in phase noise are introduced. Copyright © 2015 John Wiley & Sons, Ltd.
Year
DOI
Venue
2016
10.1002/cta.2083
Periodicals
Keywords
Field
DocType
flicker noise, impulse sensitivity function (ISF), parasitic capacitance, phase noise, VCO, class-C
Flicker noise,Noise (electronics),Phase noise,Electronic engineering,Noise temperature,Effective input noise temperature,Noise generator,Shot noise,Mathematics,Burst noise
Journal
Volume
Issue
ISSN
44
2
0098-9886
Citations 
PageRank 
References 
2
0.41
17
Authors
2
Name
Order
Citations
PageRank
Amir Nikpaik1132.06
Abdolreza Nabavi24717.09