Title
Competence model for embedded micro-and nanosystems
Year
DOI
Venue
2012
10.1109/EDUCON.2012.6201062
EDUCON
Keywords
Field
DocType
parallel processing,bottom up,nanoelectronics,embedded systems,system engineering,computer science,software fault tolerance,redundancy,mathematics,embedded system,fault tolerance,hardware,fault tolerant
Systems engineering,Parallel processing,Knowledge management,Software fault tolerance,Competence model,Fault tolerance,Content validity,Engineering,Computer engineering
Conference
Citations 
PageRank 
References 
4
0.57
8
Authors
8
Name
Order
Citations
PageRank
andre schafer140.57
Rainer Brück23211.71
Bruno Kleinert3203.72
Harald Schmidt4202.37
Dietmar Fey535570.76
Steffen Büchner6112.20
Steffen Jaschke7213.08
Sigrid Schubert87910.76