Title
Correction to "Voltage-Comparator-Based Measurement of Equivalently Sampled Substrate Noise Waveforms in Mixed-Signal Integrated Circuits"
Year
DOI
Venue
1996
10.1109/JSSC.1996.508275
IEEE Journal of Solid-State Circuits
Keywords
DocType
Volume
Voltage,Noise measurement,Semiconductor device noise,Integrated circuit noise,Substrates,Integrated circuit measurements,Circuit noise,Solid state circuits,Circuit simulation,Analog circuits
Journal
31
Issue
ISSN
Citations 
8
0018-9200
0
PageRank 
References 
Authors
0.34
0
5
Name
Order
Citations
PageRank
keiko makiefukuda100.34
takanobu anbo200.34
Toshiro Tsukada3204.74
t matsuura400.34
masao hotta500.34