Title
Direct Mismatch Characterization of femto-Farad Capacitors
Abstract
Reducing the capacitance of programmable capacitor arrays (PCAs), commonly used in analog integrated circuits, is necessary for low-energy applications. However, limited mismatch data are available for small capacitors. We report mismatch measurement for a 2-fF poly-insulator-poly (PIP) capacitor, which is the smallest reported PIP capacitor to the best of the authors' knowledge. Instead of using ...
Year
DOI
Venue
2016
10.1109/TCSII.2015.2468919
IEEE Transactions on Circuits and Systems II: Express Briefs
Keywords
Field
DocType
Capacitors,Noise,Principal component analysis,Standards,Semiconductor device measurement,Temperature measurement,Noise measurement
Monte Carlo method,Film capacitor,Capacitor,Capacitance,Noise measurement,Filter capacitor,Capacitive sensing,Electronic engineering,Integrated circuit,Electrical engineering,Mathematics
Journal
Volume
Issue
ISSN
63
2
1549-7747
Citations 
PageRank 
References 
0
0.34
0
Authors
4
Name
Order
Citations
PageRank
Hesham Omran1286.37
rami afandy200.34
Muhammad Arsalan3467.21
Khaled N. Salama434546.11