Name
Abstract | ||
|---|---|---|
Since a logic circuit often has too many paths to test delay of all paths, it is necessary for path delay testing to limit the number of paths to be tested. The paths to be tested should have large delay because such paths more likely cause a fault. Additionally, a test set for the paths are required to detect other models of faults as many as possible. In this paper, we investigate two typical criteria of path selection for path delay testing. From our experiments, we observe that test patterns for the longest paths cannot cover many local delay defects such as transition faults. |
Year | Venue | Keywords |
|---|---|---|
2003 | IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES | delay testing, path delay fault, path selection, untestable path |
DocType | Volume | Issue |
Journal | E86A | 12 |
ISSN | Citations | PageRank |
1745-1337 | 0 | 0.34 |
References | Authors | |
0 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| masayasu fukunaga | 1 | 0 | 0.34 |
| Seiji Kajihara | 2 | 0 | 1.69 |
| Sadami Takeoka | 3 | 0 | 0.34 |
| Shinichi Yoshimura | 4 | 0 | 0.34 |