Title
New Uncertainty Analysis for Permittivity Measurements Using the Transmission/ Reflection Method
Abstract
We have developed a new algorithm for the uncertainty analysis of permittivity calculations of high-loss materials using the transmission/reflection (T/R) method. In the T/R method, several calculation procedures are performed to derive the permittivity. In our method, the permittivity is derived from measured S-parameters by solving an equation in which S-parameters are included in the form (S₂₁+S₁₂)+β (S₁₁+₂₂), where β is a weighted factor to be optimized to minimize the uncertainty. We confirmed its efficacy by doing numerical calculations, as well as using actual measurement data for several materials obtained with a waveguide fixture. We also considered the effect of the type of calibration method used on a vector network analyzer on the permittivity uncertainty, and quantitatively clarified that it is essential to develop a highly accurate S-parameter measurement system to perform permittivity measurements using the T/R method accurately.
Year
DOI
Venue
2015
10.1109/TIM.2015.2401231
IEEE Trans. Instrumentation and Measurement
Keywords
Field
DocType
Network analyzer, permittivity measurement, S-parameter, transmission/reflection (T/R) method, uncertainty
Network analyzer (electrical),Permittivity,System of measurement,Waveguide,Measurement uncertainty,Uncertainty analysis,Electronic engineering,Scattering parameters,Calibration,Mathematics
Journal
Volume
Issue
ISSN
PP
99
0018-9456
Citations 
PageRank 
References 
3
0.95
0
Authors
5
Name
Order
Citations
PageRank
Yuto Kato143.27
Masahiro Horibe296.40
Michitaka Ameya351.72
Satoru Kurokawa473.42
Yozo Shimada573.13