Name
Abstract | ||
|---|---|---|
Due to memory limitations, iterative methods have become the method of choice for large scale semiconductor device simulation, However, it is well known that these methods suffer from reliability problems. The linear systems that appear in numerical simulation of semiconductor devices are notoriously ill conditioned. In order to produce robust algorithms for practical problems, careful attention must be given to many implementation issues. This paper concentrates on strategies for developing robust preconditioners. In addition, effective data structures and convergence check issues are also discussed. These algorithms are compared with a standard direct sparse matrix solver on a variety of problems. |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1137/0917009 | SIAM Journal on Scientific Computing |
Keywords | Field | DocType |
device simulation,iterative solver,preconditioning,ordering,drop tolerance,fill level | Convergence (routing),Data structure,Mathematical optimization,Linear system,Computer simulation,Iterative method,Computer science,Robustness (computer science),Solver,Sparse matrix | Journal |
Volume | Issue | ISSN |
17 | 1 | 1064-8275 |
Citations | PageRank | References |
5 | 0.82 | 5 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Qing Fan | 1 | 5 | 0.82 |
| Peter A. Forsyth | 2 | 193 | 38.63 |
| John R. F. McMacken | 3 | 5 | 0.82 |
| Wei-Pai Tang | 4 | 96 | 34.36 |