Name
Abstract | ||
|---|---|---|
The standard ESD protection schemes are not very reliable for negative charge pump used in Class G power amplifiers. This work presents a novel ESD protection scheme using internal charge pump switches as ESD clamps. Transmission line pulsing (TLP) measurements show that an elevated level of ESD protection can be achieved with this scheme. |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1016/j.microrel.2015.12.012 | Microelectronics Reliability |
Keywords | Field | DocType |
ESD,Charge pump,Class-G,Audio power amplifiers | Transmission line,Electronic engineering,Engineering,Charge pump,Electrical engineering,Amplifier | Journal |
Volume | ISSN | Citations |
57 | 0026-2714 | 0 |
PageRank | References | Authors |
0.34 | 1 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Ankit Srivastava | 1 | 0 | 0.34 |
| Gene Worley | 2 | 0 | 0.34 |
| Xiaohong Quan | 3 | 0 | 0.34 |
| Guoqing Miao | 4 | 0 | 1.01 |