Name
Abstract | ||
|---|---|---|
This paper deals with the study and the modelling of temperature effects on conducted immunity of electronic circuits. We focus first on experimental measurements using DPI (direct power injection) test bench for the characterization of conducted immunity associated to an air conditioner that allows warming up the circuit locally. It is shown that the increase of temperature seems to decrease the sensibility of the tested circuit Secondly the behavioural immunity model (ICIM-CI), developed in VHDL-AMS and taking into account temperature effects is presented. The model is finally validated by comparison with measurements. (C) 2015 Elsevier Ltd. All rights reserved. |
Year | DOI | Venue |
|---|---|---|
2015 | 10.1016/j.microrel.2015.06.018 | MICROELECTRONICS RELIABILITY |
Keywords | Field | DocType |
EMC/EMI,EMR (electromagnetic reliability),Temperature effect,Conducted immunity,Behavioural modelling | Air conditioning,Test bench,Electronic engineering,Engineering,Electronic circuit,Power injection,Operational amplifier | Journal |
Volume | Issue | ISSN |
55 | 9-10 | 0026-2714 |
Citations | PageRank | References |
1 | 0.48 | 3 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tristan Dubois | 1 | 7 | 2.81 |
| S. Hairoud | 2 | 1 | 0.48 |
| M. H. Gomes de Oliveira | 3 | 1 | 0.48 |
| Hélène Frémont | 4 | 20 | 12.71 |
| Geneviève Duchamp | 5 | 12 | 5.38 |