Name
Title | ||
|---|---|---|
T pattern fuse construction in segment metallized film capacitors based on self-healing characteristics |
Abstract | ||
|---|---|---|
•A self-healing simulation model is built and its validation is verified.•Breakdowns in metallized PP film is classified and the differences are described.•The fuse burn out mechanism is investigated and the burn-out criteria is proposed.•A simulation model for T pattern segment film is built and is of reference value. |
Year | DOI | Venue |
|---|---|---|
2015 | 10.1016/j.microrel.2015.03.006 | Microelectronics Reliability |
Keywords | Field | DocType |
Metallized polypropylene film capacitor,Segment metallized film,Fuse,Self-healing,Self-healing failure,Simulation | Current density,Self-healing,Capacitor,Film capacitor,Power systems computer aided design,Filter (signal processing),Electronic engineering,Engineering,Fuse (electrical),Electrical engineering | Journal |
Volume | Issue | ISSN |
55 | 6 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
8 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Haoyuan Li | 1 | 3 | 1.88 |
| Hua Li | 2 | 3 | 2.55 |
| Zhiwei Li | 3 | 1315 | 107.73 |
| Fu-Chang Lin | 4 | 54 | 6.11 |
| De Liu | 5 | 151 | 21.19 |
| Wenjuan Wang | 6 | 2 | 1.40 |
| Bowen Wang | 7 | 3 | 1.88 |
| Zhijian Xu | 8 | 0 | 0.34 |