Name
Abstract | ||
|---|---|---|
We study the inspection process in the context of multistage batch manufacturing, focusing on interstage coordination under capacity limits. The problem is formulated as a constrained Markov decision program. We establish the optimality of a sequential policy that is characterized by a sequence of thresholds, with certain randomization at the thresholds. We further show that such an optimal policy can be completely derived through solving a linear program, and that randomization is needed at no more than two threshold values. We discuss an application in semiconductor wafer fabrication, which motivates our study. |
Year | DOI | Venue |
|---|---|---|
1999 | 10.1287/opre.47.3.410 | Operations Research |
Field | DocType | Volume |
Dynamic programming,Mathematical optimization,Batch production,Semiconductor wafer fabrication,Wafer fabrication,Markov chain,Linear programming,Operations management,Mathematics | Journal | 47 |
Issue | ISSN | Citations |
3 | 0030-364X | 4 |
PageRank | References | Authors |
0.49 | 8 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David D. Yao | 1 | 861 | 140.51 |
| Shaohui Zheng | 2 | 99 | 9.82 |