Name
Title | ||
|---|---|---|
Estimating testability and coverage distributions of a VLSI circuit from a mixture of discrete and continuous functions |
Year | DOI | Venue |
|---|---|---|
1992 | 10.1145/143559.143672 | Selected Areas in Cryptography |
Field | DocType | ISBN |
Testability,Data mining,Continuous function,Computer science,Temporal data models,Temporal database,Clinical decision support system,Very-large-scale integration | Conference | 0-89791-502-X |
Citations | PageRank | References |
0 | 0.34 | 4 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| H. Farhat | 1 | 64 | 8.90 |
| Mansour Zand | 2 | 31 | 8.79 |
| H Saiedian | 3 | 47 | 4.49 |