Title
Live Demonstration: A Cmos Asic For Precise Reading Of A Magnetoresistive Sensor Array For Ndt
Abstract
Non-destructive testing (NDT) based on eddy currents (EC) is commonly used to detect defects in conductive materials. Usually the system includes an emitter coil, and one receiver coil or one Magnetoresistive (MR) sensor. In this work we added an interface ASIC that pre-amplifies and filters the signal from an array of MR sensors. This demo will present a new version based on the work presented at the ECNDT 2014 conference with a paper entitled "A CMOS ASIC for Precise Reading of a Magnetoresistive Sensor Array for NDT". Since this is an on-going work, improvements have been made, namely the reduction of the system thermal noise to 30 nV/root Hz, the development of a multigain amplifier and the application of the same concept and circuit to a multichannel parallel signal acquisition system. Detection of surface and buried defects will be demonstrated in different material mock-ups.
Year
Venue
Keywords
2015
2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)
signal processing, eddy current testing (ECT), NDT-wide, ASIC, CMOS, Magnetoresistive sensor, array
Field
DocType
ISSN
Computer science,Common emitter,Noise (electronics),Nondestructive testing,Application-specific integrated circuit,Electronic engineering,CMOS,Electromagnetic coil,Eddy current,Electrical engineering,Amplifier
Conference
0271-4302
Citations 
PageRank 
References 
0
0.34
1
Authors
6
Name
Order
Citations
PageRank
Diogo M. Caetano110.71
Moisés Simões Piedade24314.31
João V. Graça31409.40
Jorge R. Fernandes415434.16
Luis S. Rosado5152.77
Tiago Costa611.18