Title | ||
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7.6 A 90nm embedded 1T-MONOS flash macro for automotive applications with 0.07mJ/8kB rewrite energy and endurance over 100M cycles under Tj of 175°C |
Abstract | ||
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The computerization of automotive control has expanded the application range of micro controller units (MCUs). A high-end engine-control unit (ECU) requires high-performance Flash MCUs, which integrate high-speed CMOS logic and large high-performance embedded Flash memories (eFlash) [1,2]. There are also broad markets for motor control MCUs: used to control actuators in parts such as seats, windows, and mirrors. In order to integrate analog circuits to control the high voltage (HV) drivers in these parts, those MCUs have been manufactured in Flashless process, and external EEPROM chips are being used. EEPROM chips work as “learning memories” which store the calibration data to optimize analog circuit performance in the field. Replacement of external EEPROM chips by eFlash, resulting in less additional process cost and higher rewrite endurance, is a requirement for more elaborate learning at a higher data sampling rate. In addition to automotive grade reliability under extremely harsh temperature conditions, low power consumption is also a strong requirement as the number of MCUs used in motor control systems is increasing. |
Year | DOI | Venue |
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2016 | 10.1109/ISSCC.2016.7417946 | 2016 IEEE International Solid-State Circuits Conference (ISSCC) |
Keywords | Field | DocType |
embedded 1T-MONOS flash macro,automotive applications,rewrite energy,automotive control,application range,microcontroller units,high-end engine-control unit,high-performance flash MCU,high-speed CMOS logic,embedded Flash memories,eFlash,motor control MCU,analog circuits,high voltage drivers,flashless process,external EEPROM chips,learning memories,analog circuit performance,automotive grade reliability,motor control systems,size 90 nm,temperature 175 C | EEPROM,Analogue electronics,Computer science,Electronic engineering,CMOS,Microcontroller,Macro,EPROM,High voltage,Electrical engineering,Embedded system,Automotive industry | Conference |
ISBN | Citations | PageRank |
978-1-4673-9466-6 | 4 | 0.57 |
References | Authors | |
1 | 13 |
Name | Order | Citations | PageRank |
---|---|---|---|
Hidenori Mitani | 1 | 4 | 1.92 |
Ken Matsubara | 2 | 4 | 1.58 |
Hiroshi Yoshida | 3 | 5 | 1.29 |
Takayuki Hashimoto | 4 | 8 | 1.86 |
Hideaki Yamakoshi | 5 | 4 | 0.91 |
Shinichiro Abe | 6 | 4 | 0.57 |
Takashi Kono | 7 | 6 | 3.14 |
Yasuhiko Taito | 8 | 4 | 1.92 |
Takashi Ito | 9 | 6 | 2.46 |
Takashi Krafuji | 10 | 4 | 0.57 |
Kenji Noguchi | 11 | 4 | 0.57 |
Hideto Hidaka | 12 | 40 | 6.93 |
Tadaaki Yamauchi | 13 | 21 | 4.09 |