Paper Info
Title
On the Complexity Reduction of Laser Fault Injection Campaigns Using OBIC Measurements.
Abstract
Laser Fault Injection (LFI) is one of the most powerful methods of inducing a fault as it allows targeting only specific areas down to single transistors. The downside compared to non-invasive methods like introducing clock glitches is the largely increased search space. An exhaustive search through all parameters including dimensions for correct timing, intensity, or length might not be not feasible. Existing solutions to this problem are either not directly applicable to the fault location or require additional device preparation and access to expensive equipment. Our method utilizes measuring the Optical Beam Induced Current (OBIC) as imaging technique to find target areas like flip-flops and thus, reducing the search space drastically. This measurement is possible with existing laser scanning microscopes or well-equipped LFI setups. We provide experimental results targeting the Advanced Encryption Standard (AES) hardware accelerator of an Atmel ATXMega microcontroller.
Year
DOI
Venue
2015
10.1109/FDTC.2015.10
FDTC
Keywords
Field
DocType
fault injection, laser fault injection, optical beam induced current, laser scanning, AES, ATXMega
Glitch,Laser scanning,Brute-force search,Computer science,Reduction (complexity),Real-time computing,Electronic engineering,Microcontroller,Hardware acceleration,Optical beam-induced current,Fault injection,Embedded system
Conference
Citations 
PageRank 
References 
2
0.43
11
Authors
7
Name
Order
Citations
PageRank
Falk Schellenberg1276.05
Markus Finkeldey220.43
Bastian Richter3133.75
Maximilian Schapers420.43
Nils Gerhardt520.43
Martin Hofmann620.43
Christof Paar73794442.62