Title
Reliable and Continuous Measurement of SET Pulse Widths
Abstract
Gaining better insights into propagation and masking of radiation induced faults at some point requires the conduction of physical experiments. In our attempt to design a target ASIC for such experiments we elaborated an on-chip infrastructure that allows recording the pulse width of radiation induced voltage transients. Its unique properties are the ability to record more than one of these measurement values before having to be read out, and to be radiation tolerant. By careful circuit design and an unconventional redundancy architecture we obtained an infrastructure that provides the required features while being extremely area efficient. We motivate and present our proposed circuit architecture and evaluate it by means of a fault dictionary as well as simulation results.
Year
DOI
Venue
2015
10.1109/DSD.2015.94
Euromicro Symposium on Digital Systems Design
Keywords
Field
DocType
single event transients,monitoring architecture,pulse-widths,up/down counters,LFSR counters,MUX
System on a chip,Masking (art),Computer science,Voltage,Circuit design,Pulse-width modulation,Application-specific integrated circuit,Real-time computing,Multiplexer,Redundancy (engineering)
Conference
Citations 
PageRank 
References 
0
0.34
7
Authors
2
Name
Order
Citations
PageRank
Varadan Savulimedu Veeravalli1133.72
Andreas Steininger230849.17