Title
Matching Properties of Femtofarad and Sub-Femtofarad MOM Capacitors.
Abstract
Small metal-oxide-metal (MOM) capacitors are essential to energy-efficient mixed-signal integrated circuit design. However, only few reports discuss their matching properties based on large sets of measured data. In this paper, we report matching properties of femtofarad and sub-femtofarad MOM vertical-field parallel-plate capacitors and lateral-field fringing capacitors. We study the effect of bo...
Year
DOI
Venue
2016
10.1109/TCSI.2016.2537824
IEEE Transactions on Circuits and Systems I: Regular Papers
Keywords
Field
DocType
Capacitors,Method of moments,Capacitance,Capacitance measurement,Electrical resistance measurement,Frequency measurement,Measurement techniques
Monte Carlo method,Capacitor,Search engine,Capacitance,Chemical substance,Chip,Electronic engineering,Integrated circuit design,Electrical engineering,Imagination,Mathematics
Journal
Volume
Issue
ISSN
63
6
1549-8328
Citations 
PageRank 
References 
5
0.48
5
Authors
3
Name
Order
Citations
PageRank
Hesham Omran1286.37
Hamzah Alahmadi250.48
Khaled N. Salama334546.11