Paper Info
Title
Accelerating soft-error-rate (SER) estimation in the presence of single event transients.
Abstract
Radiation-induced soft errors have posed an ever increasing reliability challenge as device dimensions keep shrinking in advanced CMOS technology. Therefore, it is imperative to devise fast and accurate soft error rate (SER) estimation methods. Previous works mainly focus on improving the accuracy of the SER results, whereas the speed improvement is limited to partitioning and parallel processing. This paper presents an efficient SER estimation framework for combinational logic circuits in the presence of single-event transients (SETs). A novel top-down memoization algorithm is proposed to accelerate the propagation of SETs. Experimental results of a variety of benchmark circuits demonstrate that the proposed approach achieves up to 560.2X times speedup with less than 3% difference in terms of SER results compared with the baseline algorithm.
Year
DOI
Venue
2016
10.1145/2897937.2897976
DAC
Keywords
Field
DocType
soft error rate estimation,single event transients,radiation induced soft errors,CMOS technology,combinational logic circuits,top down memoization algorithm
Soft error,Computer science,Algorithm,CMOS,Real-time computing,Electronic engineering,Combinational logic,Ethernet,Acceleration,Memoization,Electronic circuit,Speedup
Conference
ISBN
Citations 
PageRank 
978-1-4673-8730-9
5
0.50
References 
Authors
8
2
Name
Order
Citations
PageRank
Ji Li19710.87
Jeff Draper229826.31