Name
Abstract | ||
|---|---|---|
This paper analyzes some of the secondary effects in estimating negative bias temperature instability (NBTI) induced threshold voltage shift on high frequency digital circuits. Therefore, a circuit model is developed to be used for statistical estimation of the threshold voltage shift. Making use of this model as well as technology computer aided design (TCAD) and SPICE simulations, a methodology is developed to estimate NBTI induced threshold voltage shift. Simulation results reveal that commonly made assumptions on digital circuits, such as: square signal assumption and ignorable effect of drain bias, may yield overestimation of the NBTI induced threshold voltage shift by more than 10% after five years of operation, which may lead to a severe underestimation of a circuit's reliability. |
Year | Venue | Keywords |
|---|---|---|
2016 | 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) | negative bias temperature instability,NBTI effects,high frequency digital circuits,threshold voltage shift,statistical estimation,technology computer aided design,TCAD,SPICE simulations,square signal assumption |
Field | DocType | ISSN |
Digital electronics,Spice,Computer science,Electronic engineering,Real-time computing,Negative-bias temperature instability,Transistor,Threshold voltage,Electrical engineering,Technology CAD | Conference | 1530-1591 |
Citations | PageRank | References |
1 | 0.39 | 3 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Ahmet Unutulmaz | 1 | 10 | 2.79 |
| Domenik Helms | 2 | 54 | 8.32 |
| Reef Eilers | 3 | 6 | 2.07 |
| Malte Metzdorf | 4 | 7 | 2.42 |
| Ben Kaczer | 5 | 49 | 12.50 |
| Wolfgang Nebel | 6 | 484 | 76.22 |