Paper Info
Title
Built-in test of millimeter-Wave circuits based on non-intrusive sensors
Abstract
This paper addresses the high-volume production test problem for millimeter-wave (mm-Wave) circuits. Bit error rate testing is the only feasible solution nowadays for mm-Wave transceivers, but is extremely costly and challenging to be implemented in high-volume production test floors. The lack of alternative solutions is due to the difficulty in extracting off-chip and processing mm-Wave frequencies. In this paper, we propose a built-in test solution that has two important attributes. First, it is based on non-intrusive sensors that are totally transparent to the mm-Wave circuit. They monitor variations in the performances of the mm-Wave circuit indirectly by virtue of offering an “image” of process variations. Second, the non-intrusive sensors operate at DC or low-frequency, thus dramatically simplifying the test of the mm-Wave circuit. We demonstrate the concept on a 65nm 60GHz mm-Wave low-noise amplifier (LNA).
Year
Venue
Keywords
2016
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
mm-Wave circuit testing,built-in test,non-intrusive sensors,alternate test
Field
DocType
ISSN
Capacitor,Transceiver,Computer science,Electronic engineering,Electric power transmission,Radio frequency,Resistor,Electronic circuit,Electrical engineering,Bit error rate,Amplifier
Conference
1530-1591
Citations 
PageRank 
References 
0
0.34
11
Authors
5
Name
Order
Citations
PageRank
Athanasios Dimakos111.04
Haralampos-G. D. Stratigopoulos225228.06
Alexandre Siligaris35810.75
Salvador Mir442656.22
Emeric de Foucauld5186.85