Title | ||
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Interval Simulated Annealing applied to Electrical Impedance Tomography image reconstruction with fast objective function evaluation. |
Abstract | ||
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The Electrical Impedance Tomography (EIT) reconstruction problem can be solved as an optimization problem in which the discrepancy between a simulated impedance domain and the observed one is minimized. This optimization problem can be solved by a combination of Simulated Annealing (SA) for optimization and the Finite Element Method (FEM) for simulating the impedance domain. A new objective function based on the total least squares error minimization is proposed. This objective function is ill-conditioned with dense meshes. Two possibilities to overcome ill-conditioning are considered: combination with another objective function (Euclidean distance) and inclusion of a regularization term. To speed up the algorithm, results from previous iterations are used to improve the present iteration convergence, and a preconditioner is proposed. This new reconstruction approach is evaluated with experimental data and compared with previous approaches. |
Year | DOI | Venue |
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2016 | 10.1016/j.camwa.2016.06.021 | Computers & Mathematics with Applications |
Keywords | Field | DocType |
Simulated Annealing,Electrical Impedance Tomography,Inverse problem | Simulated annealing,Iterative reconstruction,Mathematical optimization,Preconditioner,Adaptive simulated annealing,Inverse problem,Total least squares,Optimization problem,Mathematics,Electrical impedance tomography | Journal |
Volume | Issue | ISSN |
72 | 5 | 0898-1221 |
Citations | PageRank | References |
1 | 0.37 | 6 |
Authors | ||
6 |
Name | Order | Citations | PageRank |
---|---|---|---|
Thiago de Castro Martins | 1 | 18 | 6.73 |
Marcos de Sales Guerra Tsuzuki | 2 | 5 | 2.14 |
Erick Dario León Bueno de Camargo | 3 | 5 | 2.60 |
Raul Gonzalez Lima | 4 | 39 | 8.39 |
Fernando Silva Moura | 5 | 10 | 2.34 |
Marcelo Britto Passos Amato | 6 | 31 | 5.67 |