Name
Title | ||
|---|---|---|
RF measurements to pinpoint defects in inkjet-printed, thermally and mechanically stressed coplanar waveguides. |
Abstract | ||
|---|---|---|
In this work 10-GHz-band RF measurement and microscopy characterizations were performed on thermally and mechanically long-term-stressed coplanar waveguides (CPW) to observe electrical and mechanical degradation in 1-mm-thick PPO/PPE polymer substrates with inkjet-printed Ag conductors. The structure contained two different CPW geometries in a total of 18 samples with 250/270μm line widths/gaps and 670/180μm line widths/gaps. A reliability test was carried out with three sets. In set #1 three 250μm and three 670μm lines were stored in room temperature conditions and used as a reference. In set #2 six samples were thermally cycled (TC) for 10,000cycles, and in set #3 six samples were thermally cycled and bent with 6mm and 8mm bending diameters. |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1016/j.microrel.2016.08.021 | Microelectronics Reliability |
Keywords | Field | DocType |
Inkjet printing,RF,Characterization,Reliability,TCT,Bending test | Network analyzer (electrical),Optical microscope,Waveguide,Electrical conductor,Bending,Electronic engineering,Temperature cycling,Bend radius,Engineering,Microscopy | Journal |
Volume | ISSN | Citations |
65 | 0026-2714 | 0 |
PageRank | References | Authors |
0.34 | 2 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Sami Myllymäki | 1 | 0 | 2.03 |
| J. Putaala | 2 | 7 | 3.16 |
| Jari Hannu | 3 | 17 | 3.03 |
| E. Kunnari | 4 | 18 | 3.59 |
| Matti Mäntysalo | 5 | 109 | 9.28 |