Title
Influence of failure modes and effects analysis on the average probability of failure on demand for a safety instremented system
Abstract
The international standard IEC 61508 presents the basis activities related to the life cycle of Electrical, Electronic and Programmable Electronic Systems (E/E/PE) that are used to perform safety functions. This international standard provides in part 6 the techniques used to evaluate the safety related systems by the calculation of average probability of failure on demand. This calculation depends on the safety related system architecture : 1oo1, 1oo2, 1oo2D, 2oo3 or 1oo3 where MooN (M out of N) and MooND (M out of N with diagnostic), means M channels among N channels must properly work for executing the safety function for safety instrumented system (SIS) [1] and [2]. In this paper, we propose to compare different architectures by the calculation of the average probability of failure on demand and show the influence of the diagnostic coverage DC, the proof test interval T <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> , the common cause failure factors β and ß <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">D</sub> and the efficiency K, which is associated to the 1oo2D architecture, on the calculation of the PFD <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">avg</sub> .
Year
DOI
Venue
2016
10.1109/CIST.2016.7805010
2016 4th IEEE International Colloquium on Information Science and Technology (CiSt)
Keywords
Field
DocType
Safety Instremented System (SIS),Average Probability of failure on demand (PFDavg),Safety Integrity Level (SIL),M out of N Architecture (MooN),Failure Mode and Effects Analysis (FMEA)
Failure mode and effects analysis,IEC 61508,Safety Integrity Level,Computer security,Computer science,Communication channel,International standard,Systems architecture,Safety instrumented system,Reliability engineering,Phase frequency detector
Conference
ISSN
ISBN
Citations 
2327-185X
978-1-5090-0752-3
1
PageRank 
References 
Authors
0.41
0
4
Name
Order
Citations
PageRank
Fatima Ezzahra Nadir110.41
Ibrahim Hadj Baraka210.41
Mohammed Bsiss310.41
Benaissa Amami442.85