Name
Abstract | ||
|---|---|---|
This paper proposes a novel approach to combinatorial test generation, which achieves an increase of not only the number of new combinations but also the distance between test cases. We applied our distance-integrated approach to a state-of-the-art greedy algorithm for traditional combinatorial test generation by using two distance metrics, Hamming distance, and a modified chi-square distance. Experimental results using numerous benchmark models show that combinatorial test suites generated by our approach using both distance metrics can improve interaction coverage for higher interaction strengths with low computational overhead. |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1109/ISSRE.2016.26 | 2016 IEEE 27th International Symposium on Software Reliability Engineering (ISSRE) |
Keywords | DocType | ISSN |
Combinatorial testing,t-way test generation,t-way coverage,Interaction strength,Hamming distance,Chi-square distance | Conference | 1071-9458 |
ISBN | Citations | PageRank |
978-1-4673-9003-3 | 1 | 0.36 |
References | Authors | |
26 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Eun-Hye Choi | 1 | 7 | 0.76 |
| Cyrille Artho | 2 | 588 | 44.46 |
| Takashi Kitamura | 3 | 8 | 1.55 |
| Osamu Mizuno | 4 | 70 | 4.84 |
| Akihisa Yamada | 5 | 1 | 0.36 |