Name
Title | ||
|---|---|---|
An Optical Interconnection Test Method Applicable to 100-Gb/s Transceivers Using an ATE Based Hardware |
Abstract | ||
|---|---|---|
Drastically increasing network traffic within datacenters requires high volume manufacturing for 100-Gb/s optical transceivers. This paper proposes high throughput test method for optical transceivers using Automated Test Equipment (ATE) with both optical and electrical frontend. By using proposed solution, 4.4 times higher throughput can be achieved. |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1109/ATS.2016.53 | 2016 IEEE 25th Asian Test Symposium (ATS) |
Keywords | Field | DocType |
high speed optical interconnection,ATE,high speed electrical interface,100-Gb/s ethernet,QSFP,optical transceiver | Test method,Transceiver,Computer science,Automatic test equipment,Electronic engineering,Optical performance monitoring,Jitter,Throughput,QSFP,Computer hardware,Embedded system,Adaptive optics | Conference |
ISSN | ISBN | Citations |
1081-7735 | 978-1-5090-3810-7 | 0 |
PageRank | References | Authors |
0.34 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kazuki Shirahata | 1 | 0 | 0.68 |
| Takeshi Mizushima | 2 | 0 | 0.68 |
| Tasuku Fujibe | 3 | 1 | 1.05 |
| Hidenobu Matsumura | 4 | 0 | 0.68 |
| Tomoyuki Itakura | 5 | 0 | 0.34 |
| Masahiro Ishida | 6 | 105 | 22.58 |
| Daisuke Watanabe | 7 | 14 | 4.42 |
| Shin Masuda | 8 | 0 | 0.68 |