Name
Abstract | ||
|---|---|---|
This paper describes the measurements of the ac quantum Hall effect (QHE) in epitaxial graphene in a set of six different devices. In typical graphene devices, capacitive losses cause a negative frequency dependence of the quantum Hall resistance, in contrast to the positive frequency dependence observed in GaAs devices. In one sample, very low ac dissipation was measured along with a quantum Hall... |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1109/TIM.2017.2652501 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Graphene,Current measurement,Electrical resistance measurement,Resistance,Frequency measurement,Voltage measurement,Semiconductor device measurement | Thermal Hall effect,Graphene,Capacitive sensing,Electronic engineering,Negative frequency,Impedance bridging,Quantum Hall effect,Electrical engineering,Condensed matter physics,Physics,Epitaxy | Journal |
Volume | Issue | ISSN |
66 | 6 | 0018-9456 |
Citations | PageRank | References |
0 | 0.34 | 3 |
Authors | ||
9 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Felix Luond | 1 | 0 | 0.34 |
| Cay-Christian Kalmbach | 2 | 0 | 0.34 |
| Frédéric Overney | 3 | 49 | 11.88 |
| J. Schurr | 4 | 18 | 7.99 |
| Blaise Jeanneret | 5 | 85 | 23.47 |
| André Müller | 6 | 0 | 0.34 |
| Mattias Kruskopf | 7 | 0 | 1.35 |
| K. Pierz | 8 | 10 | 3.69 |
| Franz-Josef Ahlers | 9 | 7 | 3.42 |