Title
Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS.
Year
Venue
DocType
2017
IEEE Trans. Instrumentation and Measurement
Journal
Volume
Issue
Citations 
66
6
0
PageRank 
References 
Authors
0.34
0
5
Name
Order
Citations
PageRank
Lulu Zhang101.69
Naoki Kuramoto201.35
Yasushi Azuma300.34
A. Kurokawa4132.39
Kenichi Fujii582.40