Name
Abstract | ||
|---|---|---|
The Design, Automation, and Test in Europe (DATE) 2017 Conference and Exhibition closed doors last Friday, March 31, 2017, receiving more than 1,500 registrations from over 50 countries and ending with excellent feedback from both participants and exhibitors. 2017 was a special year for the world’s favorite electronic systems design and test conference, as the community celebrated its 20th edition, and it was held for the first time in Switzerland, at the SwissTech Convention Center on the EPFL campus in Lausanne, from March 27–31, 2017. |
Year | Venue | Field |
|---|---|---|
2017 | IEEE Design & Test | Computer science,Convention,Operations research,Exhibition,Electronic systems,Library science,Computer engineering,Doors |
DocType | Volume | Issue |
Journal | 34 | 4 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| D. Atienza | 1 | 182 | 24.26 |
| Giorgio Di Natale | 2 | 368 | 54.26 |